+86 755-83044319

Events

/
  • Updated: 2023-10-17
  • Views: 5623
As the cool autumn breeze drifts in and the scent of osmanthus flowers fills the air, the double holiday of Mid-Autumn Festival and National Day in 2023 has added even more festive atmosphere. Kinghelm (www.kinghelm.net) and Slkor (www.slkoric.com) have organized an internal employee essay competition for Mid-Autumn Fe……
  • Updated: 2023-10-14
  • Views: 6462
In addition to the laboratory-scale EUV light used by NIST to analyze semiconductor components, Dr. Steve Grantham also presented a wealth of resources at NIST's Synchrotron Ultraviolet Radiation Facility (SURF III) during the working group meeting. When charged particles move along a curved path, they emit synchrot……
  • Updated: 2023-10-14
  • Views: 6451
In addition to the laboratory-scale EUV light used by NIST to analyze semiconductor components, Dr. Steve Grantham also presented a wealth of resources at NIST's Synchrotron Ultraviolet Radiation Facility (SURF III) during the working group meeting. When charged particles move along a curved path, they emit synchrot……
  • Updated: 2023-10-14
  • Views: 6567
At the working group meeting, researchers from NIST discussed three main themes related to using EUV as an analytical tool to assist the semiconductor manufacturing industry. The three methods for utilizing EUV light as an analytical technique are: (1) high harmonic generation (HHG), (2) synchrotron radiation, and (3) ……
  • Updated: 2023-10-14
  • Views: 6786
The main process change that affects yield is edge-placement error (EPE). This occurs when unexpected nanoscale irregularities are displayed in the edges and sidewalls of photoresist patterns. These irregularities are random and colloquially referred to as line-edge roughness (LER). As device sizes continue to shrink, ……
  • Updated: 2023-10-14
  • Views: 6324
Absolute radiometric measurement is important not only for the development of lithography processes and instrument acceptance tests but also for the quantitative understanding of EUV light generation processes. Predictive modeling of this process has lagged behind the development of EUV tools themselves. Improving mode……
  • Updated: 2023-10-14
  • Views: 6488
NIST is currently developing an instrument for measuring SoS at higher pressures and temperatures. The SoS instrument is part of Dr. Elizabeth Rasmussen's National Research Council (NRC) postdoctoral fellowship in metal additive manufacturing. A U.S. patent on the design and operation of the instrument was submitted in……
  • Updated: 2023-10-14
  • Views: 6661
2.1 Droplet Generator: Extreme Thermophysical Properties and Modeling The droplet generator is an important component of the EUVL scanner assembly (Figure 3)……
  • Updated: 2023-10-14
  • Views: 6522
In 2022, the semiconductor market was approximately 0.6 trillion USD, and commercial analysts predict that it will double to 1.0-1.3 trillion USD by 2030. The significant growth in the semiconductor manufacturing industry can be seen in the lithography process. Lithography is a patterning process that transfers a flat ……
  • Updated: 2023-10-13
  • Views: 6779
​Due to the war with Ukraine and the resulting global isolation and sanctions, Russia is devising a plan to revive its struggling domestic semiconductor manufac……
  • Updated: 2023-10-13
  • Views: 6212
​For the same task, the energy consumption of this chip for on-chip learning is only 3% of that of the Advanced Process-Specific Integrated Circuit (ASIC) syste……

News recommendation

Service hotline

+86 0755-83044319

Hall Effect Sensor

Get product information

WeChat

WeChat