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Understanding industry dynamics is crucial for businesses and practitioners. It provides valuable information that helps us make informed decisions, maintain competitive advantages, and adapt to constantly changing market environments.
  • Updated: 2023-10-14
  • Views: 7797
In addition to the laboratory-scale EUV light used by NIST to analyze semiconductor components, Dr. Steve Grantham also presented a wealth of resources at NIST's Synchrotron Ultraviolet Radiation Facility (SURF III) during the working group meeting. When charged particles move along a curved path, they emit synchrot……
  • Updated: 2023-10-14
  • Views: 7559
In addition to the laboratory-scale EUV light used by NIST to analyze semiconductor components, Dr. Steve Grantham also presented a wealth of resources at NIST's Synchrotron Ultraviolet Radiation Facility (SURF III) during the working group meeting. When charged particles move along a curved path, they emit synchrot……
  • Updated: 2023-10-14
  • Views: 7671
At the working group meeting, researchers from NIST discussed three main themes related to using EUV as an analytical tool to assist the semiconductor manufacturing industry. The three methods for utilizing EUV light as an analytical technique are: (1) high harmonic generation (HHG), (2) synchrotron radiation, and (3) ……
  • Updated: 2023-10-14
  • Views: 8109
The main process change that affects yield is edge-placement error (EPE). This occurs when unexpected nanoscale irregularities are displayed in the edges and sidewalls of photoresist patterns. These irregularities are random and colloquially referred to as line-edge roughness (LER). As device sizes continue to shrink, ……
  • Updated: 2023-10-14
  • Views: 7399
Absolute radiometric measurement is important not only for the development of lithography processes and instrument acceptance tests but also for the quantitative understanding of EUV light generation processes. Predictive modeling of this process has lagged behind the development of EUV tools themselves. Improving mode……
  • Updated: 2023-10-14
  • Views: 8245
NIST is currently developing an instrument for measuring SoS at higher pressures and temperatures. The SoS instrument is part of Dr. Elizabeth Rasmussen's National Research Council (NRC) postdoctoral fellowship in metal additive manufacturing. A U.S. patent on the design and operation of the instrument was submitted in……
  • Updated: 2023-10-14
  • Views: 8165
2.1 Droplet Generator: Extreme Thermophysical Properties and Modeling The droplet generator is an important component of the EUVL scanner assembly (Figure 3)……
  • Updated: 2023-10-14
  • Views: 8292
In 2022, the semiconductor market was approximately 0.6 trillion USD, and commercial analysts predict that it will double to 1.0-1.3 trillion USD by 2030. The significant growth in the semiconductor manufacturing industry can be seen in the lithography process. Lithography is a patterning process that transfers a flat ……
  • Updated: 2023-10-13
  • Views: 8067
​Due to the war with Ukraine and the resulting global isolation and sanctions, Russia is devising a plan to revive its struggling domestic semiconductor manufac……
  • Updated: 2023-10-13
  • Views: 7249
​For the same task, the energy consumption of this chip for on-chip learning is only 3% of that of the Advanced Process-Specific Integrated Circuit (ASIC) syste……
  • Updated: 2023-10-10
  • Views: 7474
Recently, Reuters reported that OpenAI is considering self-developed chips. According to the report, since last year, OpenAI has been actively seeking solutions to the shortage of training chips for artificial intelligence models (specifically, the scarcity of Nvidia GPUs). Currently, OpenAI is actively preparing for s……

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